Fault diagnosis of reducers based on digital twins and deep learning
Wei‐Min Liu, Bin Han, Aiyun Zheng, Zhi Zheng, Shujun Chen, Shikui Jia
Abstract
A new method was proposed to address fault diagnosis by applying the digital twin (DT) high-fidelity behavior and the deep learning (DL) data mining capabilities. Subsequently, the proposed fault distribution GAN (FDGAN) was built to map virtual and physical entities for the data from the established test platform. Finally, the MobileViG was employed to validate the model and diagnose faults. The accuracy of the proposed method with training samples of 600 and 800 were 88.4% and 99.5%, respectively. These accuracies surpass those of other methods based on CycleGAN (98.86%), CACGAN (94.92%), ACGAN (86.45%), ML1D-GAN (82.33%), and transfer learning (99.38%). Therefore, with the integration of global connectivity, an innovative network structure, and training methods, FDGAN can effectively address challenges such as network degradation, limited feature extraction in small windows, and insufficient model robustness.