Electrical and dielectric properties of Al/(PVP: Zn-TeO2)/p-Si heterojunction structures using current–voltage (I–V) and impedance-frequency (Z–f) measurements
Yashar Azizian‐Kalandaragh, Javid Farazin, Ş. Altındal, Mehdi Shahedi Asl, Gholamreza Pirgholi‐Givi, Seyed Ali Delbari, Abbas Sabahi Namini
Topics & Concepts
Analytical Chemistry (journal)DielectricThermionic emissionMaterials scienceHeterojunctionDielectric spectroscopyElectrical resistivity and conductivityScanning electron microscopeChemistryElectronElectrodeOptoelectronicsElectrochemistryPhysical chemistryQuantum mechanicsEngineeringElectrical engineeringComposite materialPhysicsChromatographySemiconductor materials and interfacesSemiconductor materials and devicesIntegrated Circuits and Semiconductor Failure Analysis