Litcius/Paper detail

A remaining useful life prediction method of aluminum electrolytic capacitor based on wiener process and similarity measurement

Jin Zhao, Yang Zhou, Qi Zhu, Yujin Song, Yang Liu, Hui Luo

2023Microelectronics Reliability28 citationsDOI

Topics & Concepts

Similarity (geometry)CapacitorProcess (computing)Reliability (semiconductor)Matrix similarityLinearityComputer scienceNonlinear systemData miningDegradation (telecommunications)Wiener processArtificial intelligenceEngineeringElectronic engineeringVoltageMathematicsStatisticsPower (physics)Mathematical analysisImage (mathematics)Quantum mechanicsPhysicsOperating systemPartial differential equationElectrical engineeringReliability and Maintenance OptimizationSilicon Carbide Semiconductor TechnologiesAdvanced Battery Technologies Research