Litcius/Paper detail

Void and solder joint detection for chip resistors based on X-ray images and deep neural networks

Shuiling Pang, Meiyun Chen, Shiwo Ta, Heng Wu, Kiyoshi Takamasu

2022Microelectronics Reliability15 citationsDOI

Topics & Concepts

ResistorChipSolderingResidualMaterials scienceComputer scienceVoid (composites)StencilArtificial intelligenceElectronic engineeringAlgorithmElectrical engineeringEngineeringComposite materialComputational scienceTelecommunicationsVoltageIntegrated Circuits and Semiconductor Failure AnalysisIndustrial Vision Systems and Defect DetectionElectronic Packaging and Soldering Technologies
Void and solder joint detection for chip resistors based on X-ray images and deep neural networks | Litcius