Novel multi-label feature selection via label symmetric uncertainty correlation learning and feature redundancy evaluation
Jianhua Dai, Jiaolong Chen, Ye Liu, Hu Hu
Topics & Concepts
Feature selectionMinimum redundancy feature selectionRedundancy (engineering)Pattern recognition (psychology)Artificial intelligenceComputer scienceDimensionality reductionFeature (linguistics)CorrelationCurse of dimensionalityMutual informationData miningFuzzy logicFeature vectorMachine learningMathematicsPhilosophyOperating systemLinguisticsGeometryText and Document Classification TechnologiesImage Retrieval and Classification TechniquesRough Sets and Fuzzy Logic