Digital twin enhanced fault diagnosis reasoning for autoclave
Yucheng Wang, Fei Tao, Ying Zuo, Meng Zhang, Qinglin Qi
Topics & Concepts
AutoclaveEconomic shortageFault (geology)GraphFault coverageAlgorithmReliability engineeringComputer scienceEngineeringElectronic circuitTheoretical computer scienceGeologyPhilosophyElectrical engineeringChemical engineeringSeismologyGovernment (linguistics)LinguisticsDigital Transformation in IndustryManufacturing Process and OptimizationFlexible and Reconfigurable Manufacturing Systems