Optimal metrology with programmable quantum sensors
Christian D. Marciniak, Thomas Feldker, Ivan Pogorelov, Raphael Kaubruegger, Denis V. Vasilyev, Rick van Bijnen, Philipp Schindler, P. Zoller, R. Blatt, Thomas Monz
Topics & Concepts
Quantum metrologyQuantum sensorQuantum technologyQuantum entanglementQuantum imagingQuantum limitQuantumComputer scienceMetrologyQuantum informationQuantum computerQuantum stateQuantum circuitPhysicsComputer engineeringElectronic engineeringQuantum mechanicsOpen quantum systemQuantum networkEngineeringQuantum Information and CryptographyQuantum Computing Algorithms and ArchitectureQuantum Mechanics and Applications