Litcius/Paper detail

A deep learning approach for insulator instance segmentation and defect detection

Eldad Antwi-Bekoe, Guisong Liu, Jean-Paul Ainam, Guolin Sun, Xiurui Xie

2022Neural Computing and Applications46 citationsDOI

Topics & Concepts

Computer scienceSegmentationExploitArtificial intelligenceMinimum bounding boxComputationPixelOverhead (engineering)Deep learningObject detectionBounding overwatchImage segmentationMachine learningPattern recognition (psychology)Computer visionImage (mathematics)AlgorithmOperating systemComputer securityAdvanced Neural Network ApplicationsImage Enhancement TechniquesInfrastructure Maintenance and Monitoring
A deep learning approach for insulator instance segmentation and defect detection | Litcius