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An analytical model for estimation of the stress field and cracks caused by scratching anisotropic single crystal gallium nitride

Qianqing Jiang, Lei Zhang, Chunfeng Yang

2020Materials Science in Semiconductor Processing25 citationsDOI

Topics & Concepts

Materials scienceIsotropyGallium nitrideAnisotropyStress fieldResidual stressGalliumComposite materialSingle crystalStress (linguistics)NitrideConical surfaceStructural engineeringOpticsLayer (electronics)MetallurgyFinite element methodCrystallographyEngineeringChemistryPhilosophyPhysicsLinguisticsMetal and Thin Film MechanicsGaN-based semiconductor devices and materialsAdvanced ceramic materials synthesis