Electron counting with direct electron detectors in MicroED
Johan Hattne, Max T. B. Clabbers, Michael W. Martynowycz, Tamir Gonen
Topics & Concepts
DetectorElectronResolution (logic)PhysicsElectron countingOpticsFluenceElectron microscopeElectron diffractionRadiation damageCoincidenceDiffractionRadiationNuclear physicsComputer scienceLaserMedicineArtificial intelligencePathologyAlternative medicineAdvanced Electron Microscopy Techniques and ApplicationsElectron and X-Ray Spectroscopy TechniquesX-ray Spectroscopy and Fluorescence Analysis