YOLO-IMF: An Improved YOLOv8 Algorithm for Surface Defect Detection in Industrial Manufacturing Field
Ziqiang Liu, Kejiang Ye
Topics & Concepts
Computer scienceAlgorithmArtificial intelligenceBounding overwatchMinimum bounding boxMetric (unit)Function (biology)Magnetic flux leakageSimilarity (geometry)Field (mathematics)Pattern recognition (psychology)Image (mathematics)MathematicsMagnetic fieldEngineeringBiologyPhysicsEvolutionary biologyQuantum mechanicsPure mathematicsOperations managementIndustrial Vision Systems and Defect DetectionNon-Destructive Testing TechniquesAdvanced Neural Network Applications