Litcius/Paper detail

Structural and mechanical characterization of sputtered CuxNi100-x thin film using molecular dynamics

Anh-Vu Pham, Te‐Hua Fang, Anh-Son Tran, Tao‐Hsing Chen

2020Journal of Physics and Chemistry of Solids20 citationsDOI

Topics & Concepts

NanoindentationMaterials scienceIndentationAlloySubstrate (aquarium)Composite materialMolecular dynamicsDislocationMetallurgyCrystallographyChemistryGeologyOceanographyComputational chemistryMetal and Thin Film MechanicsCopper Interconnects and ReliabilityMicrostructure and mechanical properties
Structural and mechanical characterization of sputtered CuxNi100-x thin film using molecular dynamics | Litcius