Voltage and frequency reliant interface traps and their lifetimes of the MPS structures interlayered with CdTe:PVA via the admittance method
Ç. Ş. Güçlü, Ş. Altındal, Esra Erbilen Tanrıkulu
Topics & Concepts
Materials scienceAdmittanceConductanceCapacitanceDipoleEquivalent series resistanceAcceptorDepletion regionVoltageLow frequencySemiconductorCadmium telluride photovoltaicsPolarization (electrochemistry)PolarCondensed matter physicsAnalytical Chemistry (journal)Molecular physicsOptoelectronicsPhysicsElectrical impedanceChemistryElectrodeAstronomyChromatographyQuantum mechanicsPhysical chemistrySemiconductor materials and interfacesSemiconductor materials and devicesIntegrated Circuits and Semiconductor Failure Analysis