Unified dual-label semi-supervised learning with top-k feature selection
Han Zhang, Maoguo Gong, Feiping Nie, Xuelong Li
Topics & Concepts
Computer scienceFeature selectionArtificial intelligenceMachine learningFeature (linguistics)Labeled dataSemi-supervised learningPattern recognition (psychology)Constraint (computer-aided design)Dual (grammatical number)Norm (philosophy)MathematicsPolitical scienceLawArtPhilosophyGeometryLinguisticsLiteratureMachine Learning and Data ClassificationFace and Expression RecognitionMachine Learning and ELM