Measurement in-plane deformations in electronic speckle pattern interferometry using phase-shifting modulated by polarization
Gustavo A. Gómez-Méndez, Amalia Martínez-García, David I. Serrano-García, J. A. Rayas, Areli Montes Pérez, J. M. Islas-Islas, Noel Ivan Toto-Arellano
Abstract
We propose to combine electronic speckle pattern interferometry with polarizing phase-shifting techniques to measure in-plane displacement fields. We present the technical and theoretical procedures for its implementation, added with the necessary calibration procedures employing a commercial polarimeter. Finally, we tested our proposal experimentally using a two-phase step algorithm to measure in-plane displacements on a latex sample.
Topics & Concepts
PolarimeterOpticsElectronic speckle pattern interferometrySpeckle patternInterferometryPolarization (electrochemistry)Speckle imagingMeasure (data warehouse)Phase (matter)PolarimetryMetrologyPhysicsComputer scienceQuantum mechanicsScatteringChemistryPhysical chemistryDatabaseOptical measurement and interference techniquesSurface Roughness and Optical MeasurementsAdvanced Measurement and Metrology Techniques