A two-stage unsupervised approach for surface anomaly detection in wire and arc additive manufacturing
Hao Song, Chenxi Li, Youheng Fu, Runsheng Li, Haiou Zhang, Guilan Wang
Topics & Concepts
Process (computing)Computer scienceQuality (philosophy)Artificial intelligenceAnomaly detectionProduct (mathematics)Unsupervised learningSet (abstract data type)Pattern recognition (psychology)Machine learningData miningMathematicsOperating systemEpistemologyGeometryPhilosophyProgramming languageAdditive Manufacturing Materials and ProcessesIndustrial Vision Systems and Defect DetectionAdditive Manufacturing and 3D Printing Technologies