Degradation modeling and remaining useful life prediction for dependent competing failure processes
Tao Yan, Yaguo Lei, Naipeng Li, Biao Wang, Wenting Wang
Topics & Concepts
Degradation (telecommunications)Particle filterComputer scienceReliability engineeringExpression (computer science)EstimationFilter (signal processing)EngineeringSystems engineeringProgramming languageComputer visionTelecommunicationsReliability and Maintenance OptimizationMachine Fault Diagnosis TechniquesStatistical Distribution Estimation and Applications