Multi-stage unsupervised fabric defect detection based on DCGAN
Wei Cheng, Jiuzhen Liang, Hao Liu, Zhenjie Hou, Zhan Huan
Topics & Concepts
Artificial intelligenceComputer sciencePattern recognition (psychology)ResidualSegmentationPixelClassifier (UML)Computer visionImage segmentationAlgorithmIndustrial Vision Systems and Defect DetectionImage Processing Techniques and ApplicationsIntegrated Circuits and Semiconductor Failure Analysis