Determining effective crack lengths from electrical measurements in polymer-supported thin films
Олександр Глушко, Barbara Pütz, Megan J. Cordill
Topics & Concepts
Materials scienceComposite materialThin filmPolyimideDeformation (meteorology)PolymerUltimate tensile strengthCharacterization (materials science)Layer (electronics)NanotechnologyForce Microscopy Techniques and ApplicationsIntegrated Circuits and Semiconductor Failure AnalysisSmart Materials for Construction