Band alignment of two-dimensional h-BN/MoS2 van der Waals heterojunction measured by X-ray photoelectron spectroscopy
Shu’an Xing, Guijuan Zhao, Jie Wang, Yan Xu, Zhixin Ma, Xunshuan Li, Wenge Yang, Guipeng Liu, Jianhong Yang
Topics & Concepts
HeterojunctionX-ray photoelectron spectroscopyvan der Waals forceConduction bandValence bandMonolayerBand offsetElectronic band structureChemistryMaterials scienceAnalytical Chemistry (journal)Condensed matter physicsBand gapOptoelectronicsNanotechnologyPhysicsMoleculeNuclear magnetic resonanceElectronQuantum mechanicsOrganic chemistryChromatography2D Materials and ApplicationsMXene and MAX Phase MaterialsGraphene research and applications