Noise-induced phase error comparison in multi-frequency phase-shifting profilometry based on few fringes
Jianhua Wang, Yanxi Yang, Peng Xu, Jintao Liu
Topics & Concepts
ProfilometerRobustness (evolution)Phase (matter)Computer scienceReliability (semiconductor)Phase noiseAlgorithmPhase unwrappingOpticsInterferometryMaterials sciencePhysicsSurface finishPower (physics)GeneChemistryQuantum mechanicsComposite materialBiochemistryOptical measurement and interference techniquesAdvanced Measurement and Metrology TechniquesImage Processing Techniques and Applications