Sensitive Direct Converting X‐Ray Detectors Utilizing Crystalline CsPbBr<sub>3</sub> Perovskite Films Fabricated via Scalable Melt Processing
Gebhard J. Matt, Ievgen Levchuk, Judith Knüttel, Johannes Dallmann, Andres Osvet, Mykhailo Sytnyk, Xiaofeng Tang, Jack Elia, Rainer Hock, Wolfgang Heiß, Christoph J. Brabec
Abstract
Abstract Here the fabrication of an inorganic metal‐halide perovskite CsPbBr 3 based X‐ray detector is reported utilizing a simple, scalable, and cost‐sensitive melt processing directly on substrate of any size. X‐ray diffraction analysis on the several 100 mm thick melt processed films confirms crystalline domains in the cm 2 range. The CsPbBr 3 film features a resistance of 8.5 GΩ cm and a hole mobility of 18 cm 2 V −1 s −1 . An X‐ray to current conversion rate of 1450 µC Gy air −1 cm −2 at an electric field of 1.2 × 10 4 V cm −1 and a detection limit in the sub µ Gy air s −1 regime is demonstrated. The high crystallinity and chemical purity of the melt processed CsPbBr 3 films are suggested to be responsible for a performance which is on par to current state‐of‐the‐art Cd(Zn)Te based X‐ray detector technology.