Thickness dependence of PbZr0.52Ti0.48O3 thin film ferroelectric parameters
Xinjie Wang, Yi‐Chi Wang, Biaolin Peng, Jianyu Deng, Ya Yang, Wenhong Sun, Zhong Lin Wang, Wenhong Sun, Zhong Lin Wang
Topics & Concepts
Materials scienceFerroelectricityTetragonal crystal systemCoercivityDielectricThin filmPolarization (electrochemistry)Transmission electron microscopyPermittivityCondensed matter physicsPhase (matter)OptoelectronicsNanotechnologyPhysical chemistryChemistryPhysicsOrganic chemistryFerroelectric and Piezoelectric MaterialsMultiferroics and related materialsDielectric materials and actuators