Field-Circuit Co-Simulation Method for Electrostatic Discharge Investigation in Electronic Products
Lanlan Yang, Chang Yang, Yan Tu, Xiangji Wang, Qian Wang
Abstract
Electrostatic discharge (ESD) plays an important role in the hard or soft failure of electronic products due to its high voltage, strong electric field, instantaneous high current, and a wide spectrum electromagnetic radiation. A field-circuit co-simulation method combining circuit elements and full-wave 3D model is applied to investigate ESD effects on a system including ESD generator, electronic device and IC chips on PCB, which can obtain both the electromagnetic field and the voltage/current information. The signal transmitting can be monitored under ESD-event when different discharge voltage polarity and protective enclosures are applied. Moreover, transient voltage suppressors can be appended to the field-circuit co-simulation model and their effects to ESD protection are investigated. The research on the field-circuit co-simulation of electronic products puts forward a more practical simulation method for electrostatic discharge.