Measuring laser beam quality, wavefronts, and lens aberrations using ptychography
Mengqi Du, Lars Loetgering, K. S. E. Eikema, Stefan Witte
Abstract
We report on an approach for quantitative characterization of laser beam quality, wavefronts, and lens aberrations using ptychography with a near-infrared supercontinuum laser. Ptychography is shown to offer a powerful alternative for both beam propagation ratio M 2 and wavefront measurements compared with existing techniques. In addition, ptychography is used to recover the transmission function of a microlens array for aberration analysis. The results demonstrate ptychography’s flexibility in wavefront metrology and optical shop testing.
Topics & Concepts
OpticsPtychographyWavefrontSupercontinuumMicrolensLens (geology)Achromatic lensLaserPhysicsWavefront sensorLaser beam qualityMetrologyLaser beamsDiffractionOptical fiberPhotonic-crystal fiberAdvanced X-ray Imaging TechniquesAdaptive optics and wavefront sensingLaser-Plasma Interactions and Diagnostics