Studies on structural and dielectric properties of NbO<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline" id="d1e410" altimg="si59.svg"><mml:msub><mml:mrow/><mml:mrow><mml:mn>2</mml:mn></mml:mrow></mml:msub></mml:math>-Nb<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline" id="d1e418" altimg="si59.svg"><mml:msub><mml:mrow/><mml:mrow><mml:mn>2</mml:mn></mml:mrow></mml:msub></mml:math>O<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline" id="d1e426" altimg="si62.svg"><mml:msub><mml:mrow/><mml:mrow><mml:mn>5</mml:mn></mml:mrow></mml:msub></mml:math> thin-film-based devices
Karimul Islam, Rezwana Sultana, Biswarup Satpati, Supratic Chakraborty
Topics & Concepts
Analytical Chemistry (journal)DielectricX-ray photoelectron spectroscopyMaterials scienceThin filmSputteringDissipation factorTransmission electron microscopyChemistryNuclear magnetic resonanceNanotechnologyOptoelectronicsChromatographyPhysicsSemiconductor materials and devicesGa2O3 and related materialsTransition Metal Oxide Nanomaterials