Eliminating Leakage Errors in Hyperfine Qubits
David Hayes, Daniel Stack, Bryce Bjork, Andrew C. Potter, Charles H. Baldwin, Russell Stutz
Abstract
Population leakage outside the qubit subspace presents a particularly harmful source of error that cannot be handled by standard error correction methods. Using a trapped $^{171}{\mathrm{Yb}}^{+}$ ion, we demonstrate an optical pumping scheme to suppress leakage errors in atomic hyperfine qubits. The selection rules and narrow linewidth of a quadrupole transition are used to selectively pump population out of leakage states and back into the qubit subspace. Each pumping cycle reduces the leakage population by a factor of $\ensuremath{\sim}3$, allowing for an exponential suppression in the number of cycles. We use interleaved randomized benchmarking on the qubit subspace to show that this pumping procedure has negligible side effects on the qubit subspace, bounding the induced qubit memory error by $\ensuremath{\le}2.0(8)\ifmmode\times\else\texttimes\fi{}{10}^{\ensuremath{-}5}\text{ }\text{ }\mathrm{per}$ cycle, and qubit population decay to $\ensuremath{\le}1.4(3)\ifmmode\times\else\texttimes\fi{}{10}^{\ensuremath{-}7}\text{ }\text{ }\mathrm{per}$ cycle. These results clear a major obstacle for implementations of quantum error correction and error mitigation protocols.