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Unveiling the influence of temperature and interface traps on the performance of source-all-around vertical TFET

Potharaju Ramesh, Bijit Choudhuri

2024Microelectronics Journal13 citationsDOI

Topics & Concepts

Subthreshold swingTunnel field-effect transistorTransconductanceOptoelectronicsQuantum tunnellingMaterials scienceSwingTransistorHeterojunctionGain–bandwidth productField-effect transistorSemiconductorElectrical engineeringVoltagePhysicsEngineeringAmplifierOperational amplifierCMOSAcousticsAdvancements in Semiconductor Devices and Circuit DesignSemiconductor materials and devicesIntegrated Circuits and Semiconductor Failure Analysis
Unveiling the influence of temperature and interface traps on the performance of source-all-around vertical TFET | Litcius