Digital twin-assisted interpretable transfer learning: A novel wavelet-based framework for intelligent fault diagnostics from simulated domain to real industrial domain
Sheng Li, Qiubo Jiang, Yadong Xu, Ke Feng, Zhiheng Zhao, Beibei Sun, George Q. Huang
Topics & Concepts
Domain (mathematical analysis)Fault (geology)Transfer of learningArtificial intelligenceWaveletComputer sciencePattern recognition (psychology)Machine learningEngineeringMathematicsGeologyMathematical analysisSeismologyFault Detection and Control SystemsMachine Fault Diagnosis TechniquesIndustrial Vision Systems and Defect Detection