New metrics for describing atomic force microscopy data of nanostructured surfaces through topological data analysis
Aleksandr S. Aglikov, Mikhail V. Zhukov, Timur A. Aliev, Dmitry A. Kozodaev, Michael Nosonovsky, Ekaterina V. Skorb
Topics & Concepts
Surface (topology)Topological data analysisComputer scienceAtomic force microscopyNanoscopic scaleSignature (topology)Topology (electrical circuits)NanotechnologyRangingMaterials scienceAlgorithmGeometryMathematicsTelecommunicationsCombinatoricsTopological and Geometric Data AnalysisAdvanced Fluorescence Microscopy TechniquesDigital Image Processing Techniques