Importance of TEM sample thickness for measuring strain fields
Sangjun Kang, Di Wang, Christian Kübel, Xiaoke Mu
Topics & Concepts
Materials scienceScanning transmission electron microscopyTransmission electron microscopySample (material)ThinningSample preparationScatteringDeformation (meteorology)Strain (injury)Dark field microscopyOpticsMicroscopyComposite materialNanotechnologyChemistryPhysicsChromatographyEcologyMedicineBiologyInternal medicineMetallic Glasses and Amorphous AlloysMagnetic Properties and ApplicationsMagnetic properties of thin films