IGBT aging monitoring and remaining lifetime prediction based on long short-term memory (LSTM) networks
Wanping Li, Bixuan Wang, Jingcun Liu, Guogang Zhang, Jianhua Wang
Topics & Concepts
Insulated-gate bipolar transistorLong short term memoryProcess (computing)Computer scienceArtificial neural networkTerm (time)Reliability engineeringSequence (biology)Recurrent neural networkPower (physics)Healthy agingArtificial intelligenceMachine learningEngineeringVoltageElectrical engineeringMedicineOperating systemGeneticsGerontologyBiologyPhysicsQuantum mechanicsSilicon Carbide Semiconductor TechnologiesSemiconductor materials and devicesSilicon and Solar Cell Technologies