A quick BAT for evaluating the reliability of binary-state networks
Wei‐Chang Yeh
Topics & Concepts
Benchmark (surveying)Binary numberComputer scienceReliability (semiconductor)State (computer science)Binary decision diagramAlgorithmTheoretical computer scienceMathematicsPhysicsQuantum mechanicsArithmeticGeodesyGeographyPower (physics)Reliability and Maintenance OptimizationSoftware Reliability and Analysis ResearchRisk and Safety Analysis