Litcius/Paper detail

Combined experimental-FEM investigation of electrical ruggedness in double-sided cooled power modules

Ciro Scognamillo, Antonio Pio Catalano, Philippe Lasserre, Cyrille Duchesne, Vincenzo d’Alessandro, Alberto Castellazzi

2020Microelectronics Reliability17 citationsDOI

Topics & Concepts

MultiphysicsFinite element methodVoltagePartial dischargeHigh voltagePower (physics)Materials scienceDielectricNuclear engineeringElectrical engineeringMechanical engineeringMechanicsEngineeringStructural engineeringPhysicsQuantum mechanicsSilicon Carbide Semiconductor TechnologiesElectrostatic Discharge in ElectronicsElectromagnetic Compatibility and Noise Suppression