Litcius/Paper detail

Variational-state quantum metrology

Benjamin, SC, Matsuzaki, Y, Koczor, B, Jones, T, Endo, S

2020Oxford University Research Archive (ORA) (University of Oxford)107 citationsOpen Access PDF

Abstract

Quantum technologies exploit entanglement to enhance various tasks beyond their classical limits including computation, communication and measurements. Quantum metrology aims to increase the precision of a measured quantity that is estimated in the presence of statistical errors using entangled quantum states. We present a novel approach for finding (near) optimal states for metrology in the presence of noise, using variational techniques as a tool for efficiently searching the high-dimensional space of quantum states, which would be classically intractable. We comprehensively explore systems consisting of up to 9 qubits and find new highly entangled states that are not symmetric under permutations and non-trivially outperform previously known states up to a constant factor 2. We consider a range of environmental noise models; while passive quantum states cannot achieve a fundamentally superior scaling (as established by prior asymptotic results) we do observe a significant absolute quantum advantage. We finally outline a possible experimental setup for variational quantum metrology which can be implemented in near-term hardware.\n\n

Topics & Concepts

Quantum metrologyPhysicsQuantum entanglementMetrologyStatistical physicsQuantum sensorQuantum mechanicsQubitQuantumNoise (video)Quantum technologyQuantum stateQuantum computerTheoretical physicsOpen quantum systemQuantum networkComputer scienceArtificial intelligenceImage (mathematics)Quantum Computing Algorithms and ArchitectureQuantum Information and CryptographyQuantum Mechanics and Applications