Sub-Sampled Imaging for STEM: Maximising Image Speed, Resolution and Precision Through Reconstruction Parameter Refinement
Daniel Nicholls, Jack Wells, Andrew Stevens, Yalin Zheng, Jony Castagna, Nigel D. Browning
Topics & Concepts
Computer scienceSensitivity (control systems)Process (computing)Sample (material)Artificial intelligenceSampling (signal processing)InpaintingImage (mathematics)Image resolutionComputer visionResolution (logic)Data acquisitionPhysicsElectronic engineeringEngineeringFilter (signal processing)Operating systemThermodynamicsIntegrated Circuits and Semiconductor Failure AnalysisAdvanced Electron Microscopy Techniques and ApplicationsAdvanced Fluorescence Microscopy Techniques