PCB Defect Detection Method Based on Transformer-YOLO
Wei Chen, Zhongtian Huang, Qian Mu, Yi Sun
Abstract
In order to solve the problem of low accuracy and efficiency in printed circuit board(PCB) defect detection using reference methods, a Transformer-YOLO network detection model is proposed. Firstly, an imporved clustering algorithm is used to generate the anchor box suitable for the PCB defect data set of this paper. Secondly, abandoning the traditional idea of using convolutional neural network to extract image feature, Swin Transformer is used as the feature extraction network, which can effectively establish the dependency between image features. Finally, to modify the order of the channels in the feature map and enable the network to more effectively focus on the information with greater value, the convolution and attention mechanism module is added to the feature detection network component. Comparing the network model proposed in this paper with Faster R-CNN, SSD, YOLOv3, YOLOv4 and YOLOv5, the experimental results show that the proposed model improves the accuracy by 23.90%, 15.51%, 10.70%, 7.83% and 6.12% respectively, which is better than other most mainstream target detection models and has relatively small volume.