Probabilistic and defect tolerant fatigue assessment of AM materials under size effect
Xiaopeng Niu, Shun‐Peng Zhu, Jin-Chao He, Changqi Luo, Qingyuan Wang
Topics & Concepts
Extreme value theoryQuantileProbabilistic logicReliability engineeringSample size determinationFatigue limitStatisticsReliability (semiconductor)Structural engineeringComputer scienceMathematicsEngineeringPower (physics)Quantum mechanicsPhysicsAdditive Manufacturing Materials and ProcessesManufacturing Process and OptimizationFatigue and fracture mechanics