Bandpass NGD Time- Domain Experimental Test of Double-Li Microstrip Circuit
R. Vauché, Rym Assila Belhadj Mefteh, Fayrouz Haddad, Wenceslas Rahajandraibe, Fayu Wan, Sébastien Lalléchère, Glauco Fontgalland, Preeti Thakur, Atul Thakur, Blaise Ravelo
Abstract
In this article, a time-domain test on the negative group delay behavior of a double-Li-structure microstrip circuit is proposed. The feasibility of the test is validated experimentally using Gaussian envelopes modulating sine carrier frequencies inside and outside the negative group delay frequency bands.
Topics & Concepts
Group delay and phase delayMicrostripTime domainFrequency domainElectronic engineeringPhysicsSine waveBand-pass filterSineMaterials scienceComputer scienceElectrical engineeringEngineeringMathematicsFilter (signal processing)VoltageComputer visionGeometryQuantum optics and atomic interactionsQuantum and electron transport phenomenaAtomic and Subatomic Physics Research