Effective charge dynamics in Al2O3/SiO2 multilayer stacks and their influence on silicon surface passivation
Hemangi Patel, Christian Reichel, Armin Richter, Paul Masuch, Jan Benick, Stefan W. Glunz
Topics & Concepts
PassivationMaterials scienceAtomic layer depositionLayer (electronics)Field effectAnalytical Chemistry (journal)Electric fieldOptoelectronicsSiliconVoltageCharge densityNanotechnologyChemistryElectrical engineeringPhysicsChromatographyQuantum mechanicsEngineeringSemiconductor materials and devicesSilicon and Solar Cell TechnologiesSemiconductor materials and interfaces