Atomically resolved edges and defects in lead halide perovskites
Biao Yuan, Zeyu Wang, Shuchen Zhang, Christoph K. Hofer, Chuang Gao, Tamazouzt Chennit, Hongsheng Shi, Xiaoyan Wu, Yu Han, Letian Dou, Yi Yu, Timothy J. Pennycook
Topics & Concepts
HalidePerovskite (structure)Materials scienceIodideScanning transmission electron microscopySemiconductorTransmission electron microscopyCrystallographyEnhanced Data Rates for GSM EvolutionIodineCrystallographic defectChemical physicsOptoelectronicsDiffractionLead (geology)Resolution (logic)Molecular physicsElectronScanning electron microscopePtychographyElectron microscopeImpurityPerovskite Materials and ApplicationsAdvanced Semiconductor Detectors and MaterialsAdvanced Electron Microscopy Techniques and Applications