In Situ Synchrotron X‐Ray Diffraction during High‐Pressure Torsion Deformation of Ni and NiTi
Michael Kerber, Florian Spieckermann, Roman Schuster, Cornelia von Baeckmann, Torben Fischer, Norbert Schell, Thomas Waitz, Erhard Schafler
Abstract
A down‐sized high‐pressure torsion device is developed to be used in an INSTRON deformation machine available at the High Energy Materials Science beamline at PETRA III. This setup allows to obtain synchrotron diffraction patterns in situ during severe plastic straining. Two different materials are studied: in pure Ni, the dislocation density and coherently scattering domain size are analyzed; in NiTi shape memory alloy, amorphization and a reverse martensitic phase transformation are investigated. The in situ experiments facilitate the characterization of the microstructural evolution of these materials depending on uniaxial loading, hydrostatic pressure, and torsional strain.