Litcius/Paper detail

Fault: Open-Source EDA’s Missing DFT Toolchain

Manar Abdelatty, Mohamed Gaber, Mohamed Shalan

2021IEEE Design and Test17 citationsDOI

Abstract

We introduced Fault, the first and only practical open-source DFT toolchain compatible with HDL designs. Fault toolchain provides all needed utilities to generate TVs, simulate faults, and insert scan chains. The fault is aiming at filling some of the gaps in the emerging open-source EDA ecosystem. Also, Fault provides all the needed infrastructure for research activities in digital application specific integrated circuits (ASIC) testing.

Topics & Concepts

ToolchainApplication-specific integrated circuitComputer scienceFault (geology)Open sourceEmbedded systemFault coverageDatasheetElectronic circuitSoftwareEngineeringElectrical engineeringOperating systemSeismologyGeologyIntegrated Circuits and Semiconductor Failure AnalysisSemiconductor materials and devicesVLSI and Analog Circuit Testing