Method for measurement of TRISO kernel and layer volumes by X-ray computed tomography
Grant Helmreich, Dylan Richardson, Singanallur Venkatakrishnan, Amirkoushyar Ziabari
Topics & Concepts
Materials scienceTomographyParticle (ecology)Layer (electronics)IsotropyKernel (algebra)Resolution (logic)IrradiationPolishingOpticsComposite materialComputer sciencePhysicsArtificial intelligenceNuclear physicsGeologyCombinatoricsMathematicsOceanographyNuclear Materials and PropertiesNuclear reactor physics and engineeringGraphite, nuclear technology, radiation studies