AFM-in-SEM as a Tool for Comprehensive Sample Surface Analysis
Veronika Novotná, Josef Horák, Martin Konečný, Veronika Hegrová, Ondřej Novotný, Z. Nováček, Jan Neuman
Abstract
Abstract
Topics & Concepts
Atomic force microscopySurface (topology)Materials scienceSample (material)NanotechnologyChemistryChromatographyMathematicsGeometryElectron and X-Ray Spectroscopy TechniquesForce Microscopy Techniques and ApplicationsAdvanced Electron Microscopy Techniques and Applications