Application of LSTM based on the BAT-MCS for binary-state network approximated time-dependent reliability problems
Wei‐Chang Yeh, Chia-Ming Du, Shi-Yi Tan, Majid Forghani-elahabad
Topics & Concepts
Benchmark (surveying)Reliability (semiconductor)Binary numberComputer scienceMonte Carlo methodComponent (thermodynamics)AlgorithmBinary treeState (computer science)Term (time)Tree (set theory)MathematicsStatisticsArithmeticPhysicsGeodesyThermodynamicsPower (physics)Mathematical analysisGeographyQuantum mechanicsReliability and Maintenance OptimizationProbabilistic and Robust Engineering DesignPower System Reliability and Maintenance