The spatial phase-shifting measuring profilometry based on dual-frequency grating
Haihua An, Yiping Cao, Haitao Wu, Hechen Zhang, Hongmei Li
Topics & Concepts
ProfilometerGratingSpatial frequencyPhase (matter)OpticsComputer scienceStructured-light 3D scannerPhase unwrappingFeature (linguistics)Low frequencyProjection (relational algebra)Materials scienceAcousticsArtificial intelligenceAlgorithmPhysicsInterferometryTelecommunicationsLinguisticsSurface roughnessPhilosophyComposite materialScannerQuantum mechanicsOptical measurement and interference techniquesAdvanced Measurement and Metrology TechniquesOptical Systems and Laser Technology