Center-based Transfer Feature Learning With Classifier Adaptation for surface defect recognition
Yan Shi, Lei Li, Jun Yang, Yixuan Wang, Songhua Hao
Topics & Concepts
Classifier (UML)Artificial intelligenceTransfer of learningPattern recognition (psychology)Computer scienceLinear classifierFeature extractionMachine learningIndustrial Vision Systems and Defect DetectionWelding Techniques and Residual StressesNon-Destructive Testing Techniques