Single-cell level investigation of microbiologically induced degradation of passive film of stainless steel via FIB-SEM/TEM and multi-mode AFM
Tianyu Cui, Hongchang Qian, Yuntian Lou, Xudong Chen, Tong Sun, Dawei Zhang, Xiaogang Li
Topics & Concepts
Materials scienceAtomic force microscopyDegradation (telecommunications)Transmission electron microscopyCorrosionFocused ion beamNanoscopic scaleScanning electron microscopeComposite materialOptoelectronicsNanotechnologyMetallurgyIonChemistryElectronic engineeringEngineeringOrganic chemistryCorrosion Behavior and InhibitionHydrogen embrittlement and corrosion behaviors in metalsForce Microscopy Techniques and Applications