Litcius/Paper detail

Characterization and optimization of junctionless gate-all-around vertically stacked nanowire FETs for sub-5 nm technology nodes

V. Bharath Sreenivasulu, Narendar Vadthiya

2021Microelectronics Journal69 citationsDOI

Topics & Concepts

NanowireMaterials scienceOptoelectronicsField-effect transistorTransistorElectrical engineeringVoltageEngineeringAdvancements in Semiconductor Devices and Circuit DesignSemiconductor materials and devicesNanowire Synthesis and Applications
Characterization and optimization of junctionless gate-all-around vertically stacked nanowire FETs for sub-5 nm technology nodes | Litcius